Acte de conférence, colloque et atelier

Multiple Mutation Testing from Finite State Machines with Symbolic Inputs

Nguena Timo, O., Petrenko, A. et Ramesh, S. "Multiple Mutation Testing from Finite State Machines with Symbolic Inputs" dans Proceedings of the 29th IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS 2017), pp. 36-51. Volume 10533 part of the Lecture Notes in Computer Science book series. St. Petersburg, Russia, du 9 au 11 octobre 2017