Acte de conférence, colloque et atelier

Study of Trust at Device Level of the Internet of Things Architecture

Yekini, T. A., Jaafar, F. et Zavarsky, P. "Study of Trust at Device Level of the Internet of Things Architecture" dans proceedings of the 19th IEEE International Symposium on High Assurance Systems Engineering (HASE 2019). Hangzhou Zhejiang, China, le 3 janvier 2019